MAOUHOUB, Noureddine; RAIS, Khalid. Extraction of series resistance and mobility degradation parameter in MOSFETs using iterative method. Computer Science and Information Technologies, [S. l.], v. 1, n. 1, p. 26–31, 2020. DOI: 10.11591/csit.v1i1.p26-31. Disponível em: https://csit.iaesprime.org/index.php/csit/article/view/45. Acesso em: 24 sep. 2026.